Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

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Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis. / Brauer, G.; Anwand, W.; Grambole, D.; Skorupa, W.; Hou, Yue; Andreev, Andrei; Teichert, Christian; Tam, K. H.; Djurisic, A. B.

in: Nanotechnology, Jahrgang 18, 2007, S. 195301-1-195301-8.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{e2de485410a3409886b25a83042c551e,
title = "Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis",
author = "G. Brauer and W. Anwand and D. Grambole and W. Skorupa and Yue Hou and Andrei Andreev and Christian Teichert and Tam, {K. H.} and Djurisic, {A. B.}",
year = "2007",
doi = "10.1088/0957-4484/18/19/195301",
language = "English",
volume = "18",
pages = "195301--1--195301--8",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "IOP Publishing Ltd.",

}

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TY - JOUR

T1 - Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

AU - Brauer, G.

AU - Anwand, W.

AU - Grambole, D.

AU - Skorupa, W.

AU - Hou, Yue

AU - Andreev, Andrei

AU - Teichert, Christian

AU - Tam, K. H.

AU - Djurisic, A. B.

PY - 2007

Y1 - 2007

U2 - 10.1088/0957-4484/18/19/195301

DO - 10.1088/0957-4484/18/19/195301

M3 - Article

VL - 18

SP - 195301-1-195301-8

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

ER -