Scanning Probe Microscopy-based Characterization of ZnO Nanorods

Publikationen: Beitrag in Buch/Bericht/KonferenzbandBeitrag in Konferenzband

Standard

Scanning Probe Microscopy-based Characterization of ZnO Nanorods. / Teichert, Christian; Hou, Yue; Beinik, Igor; Chen, Yinyi; Djuricis, A.; Anwand, W.; Brauer, G.

Abstract CD IEEE International NanoElectronics Conference (INEC 2010). 2010. S. 438-439.

Publikationen: Beitrag in Buch/Bericht/KonferenzbandBeitrag in Konferenzband

Harvard

Teichert, C, Hou, Y, Beinik, I, Chen, Y, Djuricis, A, Anwand, W & Brauer, G 2010, Scanning Probe Microscopy-based Characterization of ZnO Nanorods. in Abstract CD IEEE International NanoElectronics Conference (INEC 2010). S. 438-439.

APA

Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W., & Brauer, G. (2010). Scanning Probe Microscopy-based Characterization of ZnO Nanorods. in Abstract CD IEEE International NanoElectronics Conference (INEC 2010) (S. 438-439)

Vancouver

Teichert C, Hou Y, Beinik I, Chen Y, Djuricis A, Anwand W et al. Scanning Probe Microscopy-based Characterization of ZnO Nanorods. in Abstract CD IEEE International NanoElectronics Conference (INEC 2010). 2010. S. 438-439

Author

Teichert, Christian ; Hou, Yue ; Beinik, Igor ; Chen, Yinyi ; Djuricis, A. ; Anwand, W. ; Brauer, G. / Scanning Probe Microscopy-based Characterization of ZnO Nanorods. Abstract CD IEEE International NanoElectronics Conference (INEC 2010). 2010. S. 438-439

Bibtex - Download

@inproceedings{ac905615f2844b3a881e95f737bb388b,
title = "Scanning Probe Microscopy-based Characterization of ZnO Nanorods",
author = "Christian Teichert and Yue Hou and Igor Beinik and Yinyi Chen and A. Djuricis and W. Anwand and G. Brauer",
year = "2010",
language = "English",
pages = "438--439",
booktitle = "Abstract CD IEEE International NanoElectronics Conference (INEC 2010)",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Scanning Probe Microscopy-based Characterization of ZnO Nanorods

AU - Teichert, Christian

AU - Hou, Yue

AU - Beinik, Igor

AU - Chen, Yinyi

AU - Djuricis, A.

AU - Anwand, W.

AU - Brauer, G.

PY - 2010

Y1 - 2010

M3 - Conference contribution

SP - 438

EP - 439

BT - Abstract CD IEEE International NanoElectronics Conference (INEC 2010)

ER -