Journal of porous materials

Journal

Additional searchable ISSN (Electronic)1573-4854

Research output

  1. 2000
  2. Published

    Observation of structural depth profile of porous silicon by atomic force microscopy

    Prohaska, T. & Chang, D., 2000, In: Journal of porous materials. p. 349-352

    Research output: Contribution to journalArticleResearchpeer-review