Julius Keckes

(Former)

Research output

  1. 2020
  2. E-pub ahead of print

    Microstructural evolution and thermal stability of AlCr(Si)N hard coatings revealed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffraction

    Jäger, N., Meindlhumer, M., Spor, S., Hruby, H., Julin, J., Stark, A., Nahif, F., Keckes, J., Mitterer, C. & Daniel, R., 18 Jan 2020, In : Acta materialia. 186.2020, March, p. 545-554 10 p.

    Research output: Contribution to journalArticleResearchpeer-review

  3. 2019
  4. E-pub ahead of print

    Inconel-Steel Multilayers by Liquid Dispersed Metal Powder Bed Fusion: Microstructure, Residual Stress and Property Gradients

    Bodner, S. C., van de Vorst, L. T. G., Zalesak, J., Todt, J., Keckes, J., Maier-Kiener, V., Sartory, B., Schell, N., Hooijmans, J. W., Saurwalt, J. J. & Keckes, J., 31 Dec 2019, In : Additive Manufacturing. 32.2019, 101027.

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    Biomimetic hard and tough nanoceramic Ti–Al–N film with self-assembled six-level hierarchy

    Meindlhumer, M., Zalesak, J., Pitonak, R., Todt, J., Sartory, B., Burghammer, M., Stark, A., Schell, N., Daniel, R., Keckes, J., Lessiak, M., Köpf, A., Weißenbacher, R. & Keckes, J., 28 Apr 2019, In : Nanoscale. 11.2019, 16, p. 7986-7995 10 p.

    Research output: Contribution to journalArticleResearchpeer-review

  6. 2016
  7. Published

    Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

    Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H. & Keckes, J., 2016, In : Acta materialia. 102, p. 212-219 8 p.

    Research output: Contribution to journalArticleResearchpeer-review

  8. 2015
  9. Published

    Complementary ab initio and X-ray nanodiffraction studies of Ta2O5

    Hollerweger, R., Holec, D., Paulitsch, J., Bartosik, M., Daniel, R., Rachbauer, R., Polcik, P., Keckes, J., Krywka, C., Euchner, H. & Mayrhofer, P. H., 2015, In : Acta Materialia.

    Research output: Contribution to journalArticleResearchpeer-review

  10. Published

    Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films

    Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.

    Research output: Contribution to conferencePosterResearchpeer-review

  11. 2009
  12. Published

    Novel technique to determine elastic constants of thin films

    Daniel, R., Keckes, J., Martinschitz, K. J. & Mitterer, C., 2009, In : Materials Research Society symposium proceedings.

    Research output: Contribution to journalArticleResearchpeer-review

  13. 2008
  14. Published