Paul Angerer

(Former)

Research output

  1. 2016
  2. Published

    Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures

    Angerer, P., Schöngrundner, R., Macurova, K., Wiessner, M. & Keckes, J., 1 Dec 2016, In : Powder diffraction. 31, 4, p. 267-273 7 p.

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Thermal stability of residual stresses in Ti-6Al-4V components

    Stanojevic, A., Angerer, P. & Oberwinkler, B., 14 Apr 2016, In : IOP Conference Series: Materials Science and Engineering. 119, 1, 012007.

    Research output: Contribution to journalConference articleResearchpeer-review