Electrically reversible cracks in an intermetallic film controlled by an electric field

Research output: Contribution to journalArticleResearchpeer-review


  • Z.Q. Liu
  • J.H. Liu
  • M.D. Biegalski
  • J.-M. Hu
  • S.L. Shang
  • Y. Ji
  • J.M. Wang
  • S.L. Hsu
  • A.T. Wong
  • B. Gludovatz
  • C. Marker
  • H. Yan
  • Z.X. Feng
  • L. You
  • M.W. Lin
  • T.Z. Ward
  • Z.K. Liu
  • C.B. Jiang
  • L.Q. Chen
  • R.O. Ritchie
  • H.M. Christen
  • R. Ramesh

Organisational units

External Organisational units

  • School of Materials Science and Engineering, Beihang University
  • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
  • Department of Materials Science and Engineering, The Pennsylvania State University
  • Department of Nuclear Engineering, University of California Berkeley
  • Materials Science and Technology Division, Oak Ridge National Laboratory
  • Erich Schmid Institute of Materials Science
  • School of Mechanical and Manufacturing Engineering, UNSW Sydney
  • School of Optical and Electronic Information, Huazhong University of Science and Technology


Original languageEnglish
Article number9
Number of pages7
JournalNature Communications
Issue number9
Publication statusPublished - 3 Jan 2018