Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy

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Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy. / Kozyrev, Yu.N.; Rubezhanska, M.Yu.; Sklyar, V. K.; Kartel, M. T.; Dmitruk, N. V.; Teichert, Christian; Hofer, Christian.

In: Dopovidi Nacional'noï Akademiï Nauk Ukraïny , 2010, p. 71-76.

Research output: Contribution to journal › Article › Research › peer-review

Harvard

Kozyrev, YN, Rubezhanska, MY, Sklyar, VK, Kartel, MT, Dmitruk, NV, Teichert, C & Hofer, C 2010, 'Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy', Dopovidi Nacional'noï Akademiï Nauk Ukraïny , pp. 71-76. <http://dspace.nbuv.gov.ua/handle/123456789/19255>

APA

Kozyrev, Y. N., Rubezhanska, M. Y., Sklyar, V. K., Kartel, M. T., Dmitruk, N. V., Teichert, C., & Hofer, C. (2010). Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy. Dopovidi Nacional'noï Akademiï Nauk Ukraïny , 71-76. http://dspace.nbuv.gov.ua/handle/123456789/19255

Vancouver

Kozyrev YN, Rubezhanska MY, Sklyar VK, Kartel MT, Dmitruk NV, Teichert C et al. Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy. Dopovidi Nacional'noï Akademiï Nauk Ukraïny . 2010;71-76.

Author

Kozyrev, Yu.N. ; Rubezhanska, M.Yu. ; Sklyar, V. K. ; Kartel, M. T. ; Dmitruk, N. V. ; Teichert, Christian ; Hofer, Christian. / Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy. In: Dopovidi Nacional'noï Akademiï Nauk Ukraïny . 2010 ; pp. 71-76.

Bibtex - Download

@article{dd8545eb87c840e4ba8cc10069d7ac15,
title = "Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy",
author = "Yu.N. Kozyrev and M.Yu. Rubezhanska and Sklyar, {V. K.} and Kartel, {M. T.} and Dmitruk, {N. V.} and Christian Teichert and Christian Hofer",
year = "2010",
language = "English",
pages = "71--76",
journal = "Dopovidi Nacional'no{\"i} Akademi{\"i} Nauk Ukra{\"i}ny ",
issn = "1025-6415",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy

AU - Kozyrev, Yu.N.

AU - Rubezhanska, M.Yu.

AU - Sklyar, V. K.

AU - Kartel, M. T.

AU - Dmitruk, N. V.

AU - Teichert, Christian

AU - Hofer, Christian

PY - 2010

Y1 - 2010

M3 - Article

SP - 71

EP - 76

JO - Dopovidi Nacional'noï Akademiï Nauk Ukraïny

JF - Dopovidi Nacional'noï Akademiï Nauk Ukraïny

SN - 1025-6415

ER -

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