Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

Gabriele Moser, Herwig Felber, Boryana Rashkova, Peter J. Imrich, Christoph Kirchlechner, Wolfgang Grosinger, C. Motz, Gerhard Dehm, Daniel Kiener

Research output: Contribution to journalArticleResearchpeer-review

21 Citations (Scopus)
Translated title of the contributionSample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing
Original languageEnglish
Pages (from-to)343-355
JournalPractical metallography = Praktische Metallographie
Volume49
Publication statusPublished - 2012

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